|
Relative Mass |
Uncertainty |
Analytical Method |
Uncertainty Method |
292 - Aluminum |
0.032 |
0.009 |
ICP-OES (AES), Inductively Coupled Plasma Optical (Atomic) Emission Spectrometer |
standard deviation |
296 - Antimony |
0.000059 |
0.000032 |
ICP-MS, inductively coupled plasma mass spectrometry |
standard deviation |
298 - Arsenic |
0.000015 |
0.000003 |
ICP-MS, inductively coupled plasma mass spectrometry |
standard deviation |
300 - Barium |
0.000931 |
0.000279 |
ICP-MS, inductively coupled plasma mass spectrometry |
standard deviation |
328 - Cadmium |
0.0000007 |
0.0000001 |
ICP-MS, inductively coupled plasma mass spectrometry |
standard deviation |
329 - Calcium |
0.127 |
0.016 |
ICP-OES (AES), Inductively Coupled Plasma Optical (Atomic) Emission Spectrometer |
standard deviation |
337 - Chloride ion |
0.002 |
0.003 |
IC, Ion chromatography |
standard deviation |
347 - Chromium |
0.000131 |
0.00004 |
ICP-MS, inductively coupled plasma mass spectrometry |
standard deviation |
379 - Cobalt |
0.000012 |
0.000002 |
ICP-MS, inductively coupled plasma mass spectrometry |
standard deviation |
380 - Copper |
0.000702 |
0.000272 |
ICP-MS, inductively coupled plasma mass spectrometry |
standard deviation |
468 - Gallium |
0.000008 |
0.000002 |
ICP-MS, inductively coupled plasma mass spectrometry |
standard deviation |
488 - Iron |
0.031 |
0.014 |
ICP-OES (AES), Inductively Coupled Plasma Optical (Atomic) Emission Spectrometer |
standard deviation |
519 - Lanthanum |
0.000015 |
0.000006 |
ICP-MS, inductively coupled plasma mass spectrometry |
standard deviation |
520 - Lead |
0.000149 |
0.000034 |
ICP-MS, inductively coupled plasma mass spectrometry |
standard deviation |
525 - Magnesium |
0.026 |
0.015 |
ICP-OES (AES), Inductively Coupled Plasma Optical (Atomic) Emission Spectrometer |
standard deviation |
526 - Manganese |
0.000485 |
0.000261 |
ICP-OES (AES), Inductively Coupled Plasma Optical (Atomic) Emission Spectrometer |
standard deviation |
528 - Mercury |
0.00000053 |
0.00000028 |
LECO, elemental analyzer |
standard deviation |
586 - Molybdenum |
0.000062 |
0.000005 |
ICP-MS, inductively coupled plasma mass spectrometry |
standard deviation |
612 - Nickel |
0.000164 |
0.000064 |
ICP-MS, inductively coupled plasma mass spectrometry |
standard deviation |
613 - Nitrate |
0.002 |
0.001 |
IC, Ion chromatography |
standard deviation |
626 - Organic carbon |
0.172 |
0.03 |
TOT thermal optical analysis EUSAAR2 protocol |
standard deviation |
666 - Phosphorus |
0.001 |
0 |
ICP-OES (AES), Inductively Coupled Plasma Optical (Atomic) Emission Spectrometer |
standard deviation |
669 - Potassium |
0.011 |
0.003 |
ICP-OES (AES), Inductively Coupled Plasma Optical (Atomic) Emission Spectrometer |
standard deviation |
689 - Rubidium |
0.000047 |
0.000012 |
ICP-MS, inductively coupled plasma mass spectrometry |
standard deviation |
693 - Selenium |
0.000004 |
0 |
ICP-MS, inductively coupled plasma mass spectrometry |
standard deviation |
696 - Sodium |
0.003 |
0.001 |
ICP-OES (AES), Inductively Coupled Plasma Optical (Atomic) Emission Spectrometer |
standard deviation |
697 - Strontium |
0.00022 |
0.000083 |
ICP-MS, inductively coupled plasma mass spectrometry |
standard deviation |
699 - Sulfate |
0.009 |
0.003 |
IC, Ion chromatography |
standard deviation |
700 - Sulfur |
0.004 |
0.001 |
ICP-OES (AES), Inductively Coupled Plasma Optical (Atomic) Emission Spectrometer |
standard deviation |
712 - Thallium |
0 |
0 |
ICP-MS, inductively coupled plasma mass spectrometry |
standard deviation |
714 - Tin |
0.000115 |
0.000058 |
ICP-MS, inductively coupled plasma mass spectrometry |
standard deviation |
715 - Titanium |
0.002064 |
0.00064 |
ICP-OES (AES), Inductively Coupled Plasma Optical (Atomic) Emission Spectrometer |
standard deviation |
765 - Uranium |
0.000004 |
0 |
ICP-MS, inductively coupled plasma mass spectrometry |
standard deviation |
767 - Vanadium |
0.000065 |
0.000006 |
ICP-MS, inductively coupled plasma mass spectrometry |
standard deviation |
777 - Yttrium |
0.000011 |
0.000005 |
ICP-MS, inductively coupled plasma mass spectrometry |
standard deviation |
778 - Zinc |
0.001141 |
0.000299 |
ICP-MS, inductively coupled plasma mass spectrometry |
standard deviation |
779 - Zirconium |
0.000167 |
0.000023 |
ICP-MS, inductively coupled plasma mass spectrometry |
standard deviation |
784 - Ammonium |
not detected |
not detected |
IC, Ion chromatography |
standard deviation |
797 - Elemental Carbon |
0.044 |
0.016 |
TOT thermal optical analysis EUSAAR2 protocol |
standard deviation |
1850 - Lithium |
0.000023 |
0.000007 |
ICP-MS, inductively coupled plasma mass spectrometry |
standard deviation |
1852 - Niobium |
0.000017 |
0.000005 |
ICP-MS, inductively coupled plasma mass spectrometry |
standard deviation |
1855 - Scandium |
0.000006 |
0.000002 |
ICP-MS, inductively coupled plasma mass spectrometry |
standard deviation |
1858 - Thorium |
0.000007 |
0.000003 |
ICP-MS, inductively coupled plasma mass spectrometry |
standard deviation |
1859 - Tungsten |
0.000003 |
0.000003 |
ICP-MS, inductively coupled plasma mass spectrometry |
standard deviation |
1861 - Cerium |
0.000032 |
0.000014 |
ICP-MS, inductively coupled plasma mass spectrometry |
standard deviation |
1862 - Cesium |
0.000004 |
0.000001 |
ICP-MS, inductively coupled plasma mass spectrometry |
standard deviation |
1865 - Germanium |
0.00000068 |
0.00000067 |
ICP-MS, inductively coupled plasma mass spectrometry |
standard deviation |
1866 - Hafnium |
0.000005 |
0.000001 |
ICP-MS, inductively coupled plasma mass spectrometry |
standard deviation |
1869 - Bismuth |
0.000006 |
0.000004 |
ICP-MS, inductively coupled plasma mass spectrometry |
standard deviation |