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SPECIEUROPE

Source profiles for Europe database

Profile: 273 - Secondary sulphates suburban

Code273
NameSecondary sulphates suburban
Source categoriesSIA, ammonium sulfate, all sources
CountryItaly
SiteGenoa
Test year2014
TypeD
Latitude44.46230
Longitude8.9015
ReferenceBove et al. 2014, doi 10.1016/j.atmosenv.2014.05.039
Notes 
Sampling MethodsPMF on Genoa Bolzaneto (suburban area) . The missing EC values were recovered by analysing the PTFE filters with a Multi Wavelength Absorbance Analyser (MWAA). TOTAL PM 14 ug/m3
Uncertainty Notesdeviazione standard dei runs FPEAK

Data

  Relative Mass Uncertainty Analytical Method Uncertainty Method
292 - Aluminum 0.000481 0 ED-XRF energy dispersive X-ray fluorescence standard deviation
329 - Calcium 0.00001 0 ED-XRF energy dispersive X-ray fluorescence standard deviation
380 - Copper 0.00001 0.000012 ED-XRF energy dispersive X-ray fluorescence standard deviation
488 - Iron 0.00001 0 ED-XRF energy dispersive X-ray fluorescence standard deviation
520 - Lead 0.000381 0.000018 ED-XRF energy dispersive X-ray fluorescence standard deviation
526 - Manganese 0.00001 0 ED-XRF energy dispersive X-ray fluorescence standard deviation
612 - Nickel 0.000016 0.000018 ED-XRF energy dispersive X-ray fluorescence standard deviation
613 - Nitrate 0.00001 0 IC, Ion chromatography standard deviation
626 - Organic carbon 0.10708 0.012577 TOT thermal optical analysis EUSAAR2 protocol standard deviation
669 - Potassium 0.003134 0.000116 ED-XRF energy dispersive X-ray fluorescence standard deviation
694 - Silicon 0.00001 0 ED-XRF energy dispersive X-ray fluorescence standard deviation
699 - Sulfate 0.527057 0.005356 IC, Ion chromatography standard deviation
715 - Titanium 0.00001 0 ED-XRF energy dispersive X-ray fluorescence standard deviation
767 - Vanadium 0.000071 0 ED-XRF energy dispersive X-ray fluorescence standard deviation
778 - Zinc 0.000639 0.000055 ED-XRF energy dispersive X-ray fluorescence standard deviation
784 - Ammonium 0.174087 0.003568 IC, Ion chromatography standard deviation
785 - Sodium ion 0.003594 0.000634 IC, Ion chromatography standard deviation
797 - Elemental Carbon 0.00001 0 TOT thermal optical analysis EUSAAR2 protocol standard deviation